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Viac informácií o knihe Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 450 bodov

Anotácia knihy

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. 

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Energy technology & engineering Electrical engineering

• Celý názov: Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
• Autor: Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 172
• EAN: 9789811931345
• ID: 43659892
• Nakladateľ: Springer, Berlin
• Rozmery: 235 × 155 mm
• Rok vydania: 2023

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