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Viac informácií o knihe VLSI Design and Test

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• Anotácia kniha
• Obľúbené z iného súdka

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Anotácia knihy

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Parametre knihy

Zaradenie knihy Knihy po anglicky Computing & information technology Computer hardware

• Celý názov: VLSI Design and Test
• Podnázov: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
• Autor: S. Rajaram, N. B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 722
• EAN: 9789811359491
• ID: 20943800
• Nakladateľ: Springer Verlag, Singapore
• Hmotnosť: 1116 g
• Rozmery: 235 × 155 × 40 mm
• Dátum vydania: 25. January 2019

Obľúbené z iného súdka

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