Mohlo by sa vám tiež páčiť

Viac informácií o knihe A Novel approach for Fault Tolerant Nano Memory Applications

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 96 bodov

Anotácia knihy

NANOTECHNOLOGY provides smaller, faster, and lower energy devices which allow more powerful and compact circuitry; However, these benefits come with a cost-the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that the transient fault rate of an individual nanoscale device (e.g., transistor or nanowire) may be orders of magnitude higher than today's devices. A failure is said to have occurred in a circuit or system if it deviates from its specified behavior. A fault on the other hand is physical defect which may or may not cause a failure. The failure rate, also known as the hazard rate and defined as number of failures per unit time compared with the number of surviving components. A fault is characterized by its nature, value, extent & duration.

Parametre knihy

• Celý názov: A Novel approach for Fault Tolerant Nano Memory Applications
• Autor: Chinnala Pavan Kumar
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 68
• EAN: 9783659894411
• ID: 13497762
• Nakladateľ: LAP Lambert Academic Publishing
• Hmotnosť: 118 g
• Rozmery: 220 × 150 × 4 mm
• Rok vydania: 2016

Obľúbené z iného súdka

---

---

---