Kód: 22569070
Abstract: A process-based model (UFET) for deep-submicron bulk-silicon MOSFETs is developed and verified with numerical device simulations and measured data. The charge-based model is physical with accountings for the predominant ... celý popis
Nákupom získate 273 bodov
Abstract: A process-based model (UFET) for deep-submicron bulk-silicon MOSFETs is developed and verified with numerical device simulations and measured data. The charge-based model is physical with accountings for the predominant short-channel (e.g., c
Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Energy technology & engineering Electrical engineering
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