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Viac informácií o knihe Atomic Force Microscopy: A Concise Introduction

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• Anotácia kniha
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Anotácia knihy

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

• Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.
• Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.
• Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.

Parametre knihy

Zaradenie knihy Knihy po nemecky Naturwissenschaften, Medizin, Informatik, Technik Technik Wärme-, Energie- und Kraftwerktechnik

• Celý názov: Atomic Force Microscopy: A Concise Introduction
• Autor: BURNHAM NANCY A
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 250
• EAN: 9789819823093
• ISBN: 9819823099
• ID: 49878957
• Nakladateľ: World Scientific Publishing Company
• Hmotnosť: 458 g
• Dátum vydania: 05. December 2025

Obľúbené z iného súdka

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