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Viac informácií o knihe Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

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Anotácia knihy

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Celý názov: Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
• Autor: Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 430
• EAN: 9781441932990
• ISBN: 1441932992
• ID: 01421940
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 1390 g
• Rozmery: 229 × 152 × 25 mm
• Dátum vydania: 05. December 2010

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