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Viac informácií o knihe High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

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Anotácia knihy

This book introduces a novel framework for accurately modeling the errors in nanoscale technology and developing a smooth tool flow at high-level design abstractions to estimate error effects, which aids the development of high-level fault-tolerant techniques. In total, the book presents 6 solutions for reliability estimation (3 for fault injection and 3 for analytical estimation) and 5 techniques for reliability exploration (3 for architectural level and 2 for system-level). It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.§§

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
• Autor: Zheng Wang, Anupam Chattopadhyay
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 197
• EAN: 9789811010729
• ISBN: 9811010722
• ID: 02976144
• Nakladateľ: Springer Verlag, Singapore
• Hmotnosť: 4557 g
• Rozmery: 235 × 155 × 18 mm
• Dátum vydania: 05. July 2017

Obľúbené z iného súdka

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