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Viac informácií o knihe Semiconductor Material and Device Characterization 3e

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 729 bodov

Anotácia knihy

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Semiconductor Material and Device Characterization 3e
• Autor: Dieter K. Schroder
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 800
• EAN: 9780471739067
• ISBN: 0471739065
• ID: 01389606
• Nakladateľ: John Wiley & Sons Inc
• Hmotnosť: 1324 g
• Rozmery: 238 × 243 × 51 mm
• Dátum vydania: 11. January 2006

Obľúbené z iného súdka

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