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Viac informácií o knihe Effect of Nuclear Reactions on Integrated Circuit Reliability

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Direct charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which depends on the technology, device layout, and the incident ions fixed LET value. A Monte Carlo approach for identifying the worst-case energy is applied to certain bulk-Si and silicon-on-insulator technologies. Simulation results suggest that the decrease in charge collection beyond the worst-case energy occurs because the secondary particles produced from the high-energy nuclear reactions have less mass and higher energy and are therefore less ionizing than those produced by lower-energy reactions.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Technology: general issues Engineering: general

• Celý názov: Effect of Nuclear Reactions on Integrated Circuit Reliability
• Autor: Nathaniel Dodds
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 56
• EAN: 9783639241280
• ISBN: 3639241282
• ID: 06831777
• Nakladateľ: VDM Verlag
• Hmotnosť: 95 g
• Rozmery: 229 × 152 × 3 mm
• Dátum vydania: 02. March 2010

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