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Viac informácií o knihe Thermal-Aware Testing of Digital VLSI Circuits and Systems

• Parametre knihy
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Anotácia knihy

The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Thermal-Aware Testing of Digital VLSI Circuits and Systems
• Autor: Chattopadhyay, Santanu (Department of Electronics and Electrical Communication EngineeringIndian Institute of Technology Kharagpur, West Bengal, India
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 118
• EAN: 9780815378822
• ISBN: 9780815378822
• ID: 18912854
• Nakladateľ: Taylor & Francis Inc
• Hmotnosť: 296 g
• Rozmery: 145 × 225 × 14 mm
• Dátum vydania: 25. April 2018

Obľúbené z iného súdka

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