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Viac informácií o knihe VLSI Design and Test

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 249 bodov

Anotácia knihy

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: VLSI Design and Test
• Podnázov: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
• Autor: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 815
• EAN: 9789811074691
• ISBN: 9811074690
• ID: 18381771
• Nakladateľ: Springer Verlag, Singapore
• Hmotnosť: 1264 g
• Rozmery: 235 × 155 × 50 mm
• Dátum vydania: 22. December 2017

Obľúbené z iného súdka

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