Mohlo by sa vám tiež páčiť

Viac informácií o knihe Noncontact Atomic Force Microscopy

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 498 bodov

Anotácia knihy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific standards

• Celý názov: Noncontact Atomic Force Microscopy
• Autor: E. Meyer, S. Morita, Roland Wiesendanger
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 440
• EAN: 9783642627729
• ISBN: 9783642627729
• ID: 06617965
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 692 g
• Rozmery: 235 × 155 × 25 mm
• Dátum vydania: 23. October 2012

Obľúbené z iného súdka

---

---

---