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Viac informácií o knihe On-Line Testing for VLSI

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

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Anotácia knihy

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: On-Line Testing for VLSI
• Autor: Michael Nicolaidis, Yervant Zorian, Dhiraj K. Pradhan
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 160
• EAN: 9781441950338
• ISBN: 1441950338
• ID: 01423407
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 416 g
• Rozmery: 254 × 178 × 10 mm
• Dátum vydania: 05. December 2010

Obľúbené z iného súdka

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