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Viac informácií o knihe Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

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Nákupom získate 622 bodov

Anotácia knihy

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Physics Optical physics

• Celý názov: Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
• Autor: Nobuo Tanaka
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 616
• EAN: 9781848167896
• ISBN: 184816789X
• ID: 05103418
• Nakladateľ: Imperial College Press
• Hmotnosť: 1078 g
• Rozmery: 238 × 161 × 31 mm
• Dátum vydania: 13. October 2014

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