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Viac informácií o knihe Spectroscopic Ellipsometry for Photovoltaics

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 1179 bodov

Anotácia knihy

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Spectroscopic Ellipsometry for Photovoltaics
• Podnázov: Volume 1: Fundamental Principles and Solar Cell Characterization
• Autor: Hiroyuki Fujiwara, Robert W. Collins
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 594
• EAN: 9783319753751
• ISBN: 3319753754
• ID: 18802990
• Nakladateľ: Springer International Publishing AG
• Hmotnosť: 1058 g
• Rozmery: 165 × 243 × 36 mm
• Dátum vydania: 24. January 2019

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