Mohlo by sa vám tiež páčiť

Viac informácií o knihe Infrared Ellipsometry on Semiconductor Layer Structures

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 778 bodov

Anotácia knihy

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. §A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Infrared Ellipsometry on Semiconductor Layer Structures
• Podnázov: Phonons, Plasmons, and Polaritons
• Autor: Mathias Schubert
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 196
• EAN: 9783642062285
• ISBN: 3642062288
• ID: 01651503
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 326 g
• Rozmery: 235 × 155 × 234 mm
• Dátum vydania: 23. November 2010

Obľúbené z iného súdka

---

---

---