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Viac informácií o knihe Test and Diagnosis for Small-Delay Defects

• Parametre knihy
• Anotácia kniha
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Anotácia knihy

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Test and Diagnosis for Small-Delay Defects
• Autor: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 212
• EAN: 9781441982964
• ISBN: 1441982965
• ID: 01424413
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 518 g
• Rozmery: 235 × 155 × 17 mm
• Dátum vydania: 10. September 2011

Obľúbené z iného súdka

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