Mohlo by sa vám tiež páčiť

Informovať o naskladnení knihy

Viac informácií o knihe Fringe Pattern Analysis for Optical Metrology

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 411 bodov

Anotácia knihy

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Physics Optical physics

• Celý názov: Fringe Pattern Analysis for Optical Metrology
• Podnázov: Theory, Algorithms, and Applications
• Autor: Manuel Servin, J. Antonio Quiroga, Moises Padilla
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 344
• EAN: 9783527411528
• ISBN: 3527411526
• ID: 02718117
• Nakladateľ: Wiley-VCH Verlag GmbH
• Hmotnosť: 898 g
• Rozmery: 250 × 175 × 22 mm
• Dátum vydania: 02. July 2014

Obľúbené z iného súdka

---

---

---